RIVER PUBLISHERS IS AN INTERNATIONAL PUBLISHER THAT PUBLISHES RESEARCH MONOGRAPHS, PROFESSIONAL BOOKS, HANDBOOKS, EDITED VOLUMES AND JOURNALS WITH FOCUS ON KEY RESEARCH AREAS WITHIN THE FIELDS OF SCIENCE, TECHNOLOGY AND MEDICINE (STM).

River Publishers Series in Electronic Materials and Devices Series Read Description

On-Wafer Calibration Techniques Enabling Accurate Characterization of High-Performance Silicon Devices at the mm-Wave Range

Hardback
July 2019
9788770221122
More details
  • Publisher
    River Publishers
  • Published
    18th July
  • ISBN 9788770221122
  • Language English
  • Pages 250 pp.
  • Size 6" x 9"
$115.00
Lib E-Book

Library E-Books

We have signed up with three aggregators who resell networkable e-book editions of our titles to academic libraries. These aggregators offer a variety of plans to libraries, such as simultaneous access by multiple library patrons, and access to portions of titles at a fraction of list price under what is commonly referred to as a “patron-driven demand” model.

These editions, priced at par with simultaneous hardcover editions of our titles, are not available direct from Stylus, but only from the following aggregators:

  • Ebook Library, a service of Ebooks Corporation Ltd. of Australia
  • ebrary, based in Palo Alto, a subsidiary of ProQuest
  • EBSCO / netLibrary, Alabama

as well as through the following wholesalers: The Yankee Book Peddler subsidiary of Baker & Taylor, Inc.

July 2019
9788770221115
More details
  • Publisher
    River Publishers
  • Published
    23rd July
  • ISBN 9788770221115
  • Language English
  • Pages 250 pp.
  • Size 6" x 9"
$86.25

The increasing demand for more content, services, and security drives the development of high-speed wireless technologies, optical communication, automotive radar, imaging and sensing systems and many other mm-wave and THz applications. S-parameter measurement at mm-wave and sub-mm wave frequencies plays a crucial role in the modern IC design debug. Most importantly, however, is the step of device characterization for development and optimization of device model parameters for new technologies. Accurate characterization of the intrinsic device in its entire operation frequency range becomes extremely important and this task is very challenging.

This book presents solutions for accurate mm-wave characterization of advanced semiconductor devices. It guides through the process of development, implementation and verification of the in-situ calibration methods optimized for high-performance silicon technologies.

Technical topics discussed in the book include:

  • Specifics of S-parameter measurements of planar structures
  • Complete mathematical solution for lumped-standard based calibration methods, including the transfer Thru-Match-Reflect (TMR) algorithms
  • Design guideline and examples for the on-wafer calibration standards realized in both advanced SiGe BiCMOS and RF CMOS processes
  • Methods for verification of electrical characteristics of calibration standards and accuracy of the in-situ calibration results
  • Comparison of the new technique vs. conventional approaches: the probe-tip calibration and the pad parasitic de-embedding for various device types, geometries and model parameters
  • New aspects of the on-wafer RF measurements at mmWave frequency range and calibration assurance.

Preface

1. Motivation

2. Introduction

3. Development of Calibration Solutions

4. Design of on-Wafer Calibration Standards

5. Electrical Properties of Custom Standards

6. Verification Methods for on-Wafer Calibration

7. Advantages of in-situ Calibration

8. Addressing Issues of on-Wafer Standards

9. Selected Aspects of Measurement and Calibration Assurance

10. Conclusion and Further Research

11. Attachments

12. Bibliography

Keyword Index

Andrej Rumiantsev

Andrej Rumiantsev is with MPI Corporation, Taiwan.  

Calibration Verification; Coplanar waveguides; De-embedding, Device Characterization, Error correction; Microstrip waveguides; Millimeter wave measurements; On-wafer calibration, Probe-Tip Calibration; Process development, RF CMOS process; RF Probes, Scattering parameters measurement; Semiconductor device modeling; Semiconductor device measurements; SiGe BiCMOS process; S-Parameter Calibration